The electron and phonon temperature distribution function are calculated in thin film semiconductors. We solved the couple one-dimensional heat-diffusion equation in the linear approximation in which the physical parameters on the sample are independent of the position. We also consider the heat ux at the surface of the semiconductor as a boundary condition for the electron-phonon system instead of using a fixed temperature. From this, we obtain an expression for electron and phonon temperature respectively. The characterization of the thermal waves properties is discussed and some practical procedures for this purpose provide us information about the electron and phonon thermal parameters.

Seebeck coefficient of system Fe-Ni-Al (H25U, H25U2, H25U3, H30U2 and H30U6) alloys, under parallel measurement of the Young's modulus, density, specific electric resistance and magnetic induction of saturation in austenite, martensite and ferrite states formed by annealing, hardening and tempering has been studied. Thermo-EMF of alloys in OCK-structural state (ferrite, martensite) is larger than in GCK (austenite) one. Al has the considerable effect on the Fe-Ni alloys coefficient of thermo-EMF both in annealed and hardened states only up to content of 2.5 mass.%. The martensite aging process and opposite martensite conversion have the similar effect on the studied alloys coefficient of thermo-EMF, they produce its decrease that makes difficult the separation of these processes by the thermo-EMF method, under the continuous heating of samples in particular. The austenite aging was observed only in alloys that contained about 6% Al.